Contact:
Dr. Philip Nickl (p.nickl@fu-berlin.de)
web:

Methods:
XPS - X-ray Photoelectron Spectroscopy, TOF-SIMS - Time Of Flight Secondary Ion Mass Spectrometry

Geräte:
Iontof M6 (TOF-SIMS), directly bookable, training is mandatory, SupraFAB*
EnviroESCA (XPS), directly bookable, training is mandatory, SupraFAB*
Bruker MultiMode 8 (AFM), directly bookable, training is mandatory

Services:
none

Data storage:
Measuring data are stored on BCPstorage network drive (BCPFS).

Booking requirements:
* only usable for SupraFAB users
only unassisted measurements posible, training is mandatory